Walker, Halliday & Resnick — Interference: Problem 2

1 through 12 Reflection by thin layers. In Fig. 35-22, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays \(r_1\) and \(r_2\) interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction \(n_1\), \(n_2\), and \(n_3\), the type of interference, the thin-layer thickness \(L\) in nanometers, and the wavelength \(\lambda\) in nanometers of the light as measured in air. ... Where \(L\) is missing, give the second least thickness or the third least thickness as indicated. Data for Problem 2 from Table 35-2: \(n_1 = 1.40\) \(n_2 = 1.46\) \(n_3 = 1.85\) Type: min (minimum intensity / destructive interference) \(L\): 2nd least thickness \(\lambda = 482 \text{ nm}\)