일반물리학 2 — Interference: Problem 10

Reflection by thin layers. In Fig. 35-22, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1 and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction n1, n2, and n3, the type of interference, the thin-layer thickness L in nanometers, and the wavelength \(\lambda\) in nanometers of the light as measured in air. Where \(\lambda\) is missing, give the wavelength that is in the visible range. Problem 10 Data: \(n_1 = 1.55\) \(n_2 = 1.62\) \(n_3 = 1.33\) Type of interference: max (constructive) Thickness \(L = 285 \text{ nm}\)